Topic | Presenter | Affiliation |
GaN Material, Fabrication, and Devices | Grace Xing | Cornell University |
SiC Material, Fabrication and Devices | Victor Veliadis | North Carolina State University |
GaN Power Device Reliability | Enrico Zanoni | University of Padova |
SiC Power Device Reliability | Brett Hull | Wolfspeed |
7:30 AM – 5:00 PM | Registration for Short Course & Primer Only |
8:00 AM – 8:45 AM | Breakfast Short Course & Primer |
8:45 AM – 8:50 AM | Welcome & Speaker Introduction, Doug Weiser, Texas Instruments |
8:50 AM – 10:20 AM | GaN Material, Fabrication, and Devices – Grace Xing, Cornell University |
10:20 AM – 10:35 AM | Coffee Break for Short Course & Primer |
10:35 AM – 12:05 PM | SiC Material, Fabrication and Devices – Victor Veliadis, North Carolina State University |
12:05 PM – 1:15 PM | Lunch Break for Short Course Only |
1:15 PM – 2:45 PM | GaN Power Device Reliability – Enrico Zanoni, University of Padova |
2:45 PM – 3:00 PM | Coffee Break for Short Course Only |
3:00 PM – 4:30 PM | SiC Power Device Reliability – Brett Hull, Wolfspeed |
4:30 PM – 4:45 PM | Adjourn and feedback |